Ali’s previous work focussed on polycrystalline films of “3D” perovskites. His newest paper examines layered or “2D” perovskites.

Tirmzi, A. M.; Dwyer, R. P.; Jiang, F. & Marohn, J. A.“Light-Dependent Impedance Spectra and Transient Photoconductivity in a Ruddlesden-Popper 2D Lead-Halide Perovskite Revealed by Electrical Scanned Probe Microscopy and Accompanying Theory”, Journal of Physical Chemistry C, 2020, 124, 13639 - 13648, DOI:10.1021/acs.jpcc.0c04467.

This paper was published as part of The Journal of Physical Chemistry virtual special issue “Time-Resolved Microscopy” [url]. Our external collaborator on this project, Dr. Fangyuan Jiang, is a postdoctoral fellow in Professor David Ginger’s laboratory at the University of Washington.

This study taught us new things about both perovskites and electrical scanned probe microscopy. The paper’s abstract reads as follows.

Electric force microscopy was used to record the light-dependent impedance spectrum and the probe transient photoconductivity of a film of butylammonium lead iodide, BA2 PbI4, a 2D Ruddlesden−Popper perovskite semiconductor. The impedance spectrum of BA2 PbI4 showed modest changes as the illumination intensity was varied up to 1400  mWcm − 2, in contrast with the comparatively dramatic changes seen for 3D lead−halide perovskites under similar conditions. BA2 PbI4’s light-induced conductivity had a rise time and decay time of ∼100 μs, 104 slower than expected from direct electron−hole recombination yet 105 faster than the conductivity-recovery times recently observed in 3D lead−halide perovskites and attributed to the relaxation of photogenerated vacancies. What sample properties are probed by electric force microscope measurements remains an open question. A Lagrangian-mechanics treatment of the electric force microscope experiment was recently introduced by Dwyer, Harrell, and Marohn which enabled the calculation of steady-state electric force microscope signals in terms of a complex sample impedance. Here this impedance treatment of the tip−sample interaction is extended, through the introduction of a time-dependent transfer function, to include time-resolved electrical scanned probe measurements. It is shown that the signal in a phase-kick electric force microscope experiment, and therefore also the signal in a time-resolved electrostatic force microscope experiment, can be written explicitly in terms of the sample’s time-dependent resistance (i.e., conductivity).

This work was funded by the U.S. National Science Foundation and the U.S. Department of Energy.

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