In a conference talk last September, John introduced a new mathematical description of electrical scanned probe microscope experiments that he, Ryan Dwyer, and Lee Harrell have been developing over the last two years. This month, a high-level summary of this work was published as a short conference-proceedings paper.
Dwyer, R. P. & Marohn, J. A.“Electric force microscopy of sample having appreciable sample impedance”, NanoScientific, 2019, 16, 6 – 9 [url][pdf]
Ryan, John, and Lee are preparing a more detailed paper to be published in the coming months.
Thanks go to Debbie West at Nanoscientific for helping us prepare the conference-proceedings paper. This work was funded by the the U.S. National Science Foundation.